Contents
2014
Volume: 41 Issue 2
15 Article(s)

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Research Article
[in Chinese]
Opto-Electronic Engineering
  • Publication Date: Jan. 01, 1900
  • Vol. 41, Issue 2, 1 (2014)
Improving Recognition Accuracy of Optoelectronic Imaging Deflection System
HU Shunren
Opto-Electronic Engineering
  • Publication Date: Jan. 01, 1900
  • Vol. 41, Issue 2, 1 (2014)
Modified Model of Color Spectrophotometer SCI Condition Based on Gloss Analysis
YUAN Kun, YAN Huimin, and JIN Shangzhong
When the surface color of the same material and different gloss objects is measured, in order to remove the color measurement impact caused by the surface gloss, the diffuse illumination, the viewing angle of 8-degree illumination and specular component included illumination viewing conditions are mostly chosen. Ideall
Opto-Electronic Engineering
  • Publication Date: Jan. 01, 1900
  • Vol. 41, Issue 2, 12 (2014)
Measurement and Evaluation of CCD Camera’s Detecting Performance in Ultrafast Optic Diagnostic Systems
PENG Bodong, LI Yang, SHENG Liang, ZHANG Mei, and WEI Fuli
To establish a method of comparing record CCD camera’s performance in ultrafast optic diagnostic systems (e.g. streak cameras, frame cameras based on gated micro channel plate intensifier, etc.), the CCD camera’s main performance parameters were compared and discussed. It is the analyzing result that CCD camera’s lower
Opto-Electronic Engineering
  • Publication Date: Jan. 01, 1900
  • Vol. 41, Issue 2, 19 (2014)
Concentration Sensor of Gaseous Chlorine Dioxide with LED
YI Ying, WU Jinhui, CHEN Feng, LI Chao, LIN Song, ZHANG Zongxing, and QI Jiancheng
Opto-Electronic Engineering
  • Publication Date: Jan. 01, 1900
  • Vol. 41, Issue 2, 27 (2014)
Background Suppression of LCD Mura Defect Using B-spline Surface Fitting
LI Kun, LI Hui, LIU Yunjie, LIANG Ping, and LU Xiaopeng
A background suppression method based on B-spline surface fitting was proposed to solve the problem of the accuracy of Mura detection, which is often caused by the uneven brightness and complex background when employing machine vision on Mura detection of TFT-LCD. Under the constraint of least square criterion, bicubic
Opto-Electronic Engineering
  • Publication Date: Jan. 01, 1900
  • Vol. 41, Issue 2, 33 (2014)
Feather Quill Crease Recognition Method by Combing Manifold Kernel with LPP
YUE Hongwei, WANG Renhuang, JIN Yingying, and MING Junfeng
Aimed at the detection difficult problem of feather quill crease, the idea of non-linear manifold is introduced into crease target recognition. A feather quill crease recognition method based on locality preserving projection and manifold kernel function is proposed for feature extraction. Firstly, covariance matrices
Opto-Electronic Engineering
  • Publication Date: Jan. 01, 1900
  • Vol. 41, Issue 2, 47 (2014)
Fast Pedestrian Detection Method based on Features Fusion and Intersection Kernel SVM
SUN Rui, HOU Nenggan, and CHEN Jun
Opto-Electronic Engineering
  • Publication Date: Jan. 01, 1900
  • Vol. 41, Issue 2, 53 (2014)
Adaptive Neural Network Non-uniformity Correction Based on Edge Detection and Running on Hardware
LIU Xiu, LIU Yong, JIN Weiqi, LIN Zhaorong, and SONG Liguo
Opto-Electronic Engineering
  • Publication Date: Jan. 01, 1900
  • Vol. 41, Issue 2, 63 (2014)
The Model and Calculation of the Satellite Infrared Radiation Periodic Features
YANG Li, Lü Xiangyin, JIN Wei, ZHAO Jijin, and YANG Hua
Opto-Electronic Engineering
  • Publication Date: Jan. 01, 1900
  • Vol. 41, Issue 2, 69 (2014)
Design of a Long-wave Infrared Continuous Zoom Optical System with High Resolution
BAO Jiaqi, JI Zijuan, GE Zhenjie, LI Nan, YU Kan, and YIN Juanjuan
Opto-Electronic Engineering
  • Publication Date: Jan. 01, 1900
  • Vol. 41, Issue 2, 75 (2014)