• Electronics Optics & Control
  • Vol. 20, Issue 6, 100 (2013)
PAN Gang, LIANG Yuying, Lv Meng, and ZHANG Guolong
Author Affiliations
  • [in Chinese]
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    DOI: 10.3969/j.issn.1671-637x.2013.06.023 Cite this Article
    PAN Gang, LIANG Yuying, Lv Meng, ZHANG Guolong. Optimization Design of Double-Step-Down-Stress Accelerated Degradation Test Based on Monte-Carlo Simulation[J]. Electronics Optics & Control, 2013, 20(6): 100 Copy Citation Text show less

    Abstract

    Considering to the problems of long test timehigh cost and low efficiency for the double-step-down-stress degradation test for high-reliabilitylong-life productswe presented an optimal design method based on Monte-Carlo simulation for double-step-down-stress accelerated degradation test(DSDS-ADT).Simulation was made for the acceleration test with Monte-Carlo method.Taking the number of inspections on each unitthe number of test units and inspection frequency as variablesand the total experimental cost as a constraintthe asymptotic variance estimation of 100 pth percentile of the lifetime distribution of the product as goal functionwe established the optimal designed model of DSDS-ADT based on Monte-Carlo simulation.Simulation results verify the feasibility and the validity of this methodand provided a theoretic support for optimal design of accelerated test in life prediction of electronic equipment.
    PAN Gang, LIANG Yuying, Lv Meng, ZHANG Guolong. Optimization Design of Double-Step-Down-Stress Accelerated Degradation Test Based on Monte-Carlo Simulation[J]. Electronics Optics & Control, 2013, 20(6): 100
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