The domestic and foreign progress of picometer resolution measurements were reviewed. Typtical methods for measurement with high resolution(picometer resolution) were introduced, and the progress of picometer measurements was presented. The principles and corresponding subdivision techiniques were studied.Then, two novel measurements were proposed and analyzed. The multiple reflection interferometer was analyzed. It has the advantages of higher resoultion and more simplicity deivce than X-ray interferometer, which provide a good future in the fields of spectroscopy and high-precision measurement.