Zhen XU, De-Gang XU, Long-Hai LIU, Ji-Ning LI, Jia-Xin ZHANG, Tan WANG, Xiang REN, Xiu-Ming QIAO, Chen JIANG. Metal microstrip line defect detection of chip based on THz-TDR technology[J]. Journal of Infrared and Millimeter Waves, 2024, 43(3): 1
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